Call for Papers IEEE Signal Processing Society IEEE Journal of Selected Topics in Signal Processing SPECIAL ISSUE ON COMPRESSIVE SENSING At its core, the young field of compressive sensing (CS) is nothing more than the ability of simple algorithms to solve the seemingly intractable problem of finding the sparsest solution of a severely underdetermined linear system of equations, under realistic conditions. This leads immediately to new signal reconstruction methods that are successful with surprisingly few measurements, which in turn leads to signal acquisition methods that effect compression as part of the measurement process (hence "compressive sensing"). These recent realizations (though built upon prior work exploiting signal sparsity) have spawned an explosion of research yielding exciting results in a wide range of topics, encompassing algorithms, theory, and applications. Original papers, previously unpublished and not currently under review by another journal, are solicited for this special issue. The scope of this special issue includes, but is not limited to: - algorithms for CS - CS methods that are tolerant to noise, signal nonsparsity, or measurement nonlinearity - measurement/sampling procedures - mathematical theory of CS - CS for multiple signals or with additional information - CS for analog signals - signal processing of compressive measurements - nonadaptive signal compression or streaming dataset reduction - hardware implementation of CS systems - applications of CS Submission information is available at http://www.ece.byu.edu/jstsp . Prospective authors are required to follow the Author's Guide for manuscript preparation of the IEEE Transactions on Signal Processing at http://ewh.ieee.org/soc/sps/tsp . Manuscripts will be peer reviewed according to the standard IEEE process. Manuscript submission due: Feb. 20, 2009 First review completed: May 15, 2009 Revised manuscript due: Jul. 1, 2009 Second review completed: Sep. 15, 2009 Final manuscript due: Oct. 15, 2009 Lead guest editor: Rick Chartrand, Los Alamos National Laboratory, Los Alamos (NM), USA [email protected] Guest editors: Richard G. Baraniuk, Rice University, Houston (TX), USA [email protected] Yonina C. Eldar, Technion, Haifa, Israel [email protected] Mário A. T. Figueiredo, Instituto Superio Técnico, Lisboa, Portugal [email protected] Jared Tanner, University of Edinburgh, Edinburgh, UK [email protected] --

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